Adaptation and penetration of resin-based root canal sealers in root canals irradiated with high-intensity lasers
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Data
2015-03-01
Autores
Moura-Netto, Cacio
Volpi Mello-Moura, Anna Carolina
Palo, Renato Miotto [UNESP]
Prokopowitsch, Igor
Pameijer, Cornelis H.
Marques, Marcia Martins
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Título de Volume
Editor
Spie-soc Photo-optical Instrumentation Engineers
Resumo
This research analyzed the quality of resin- based sealer adaptation after intracanal laser irradiation. Extracted teeth (n = 168) were root canal treated and divided into four groups, according to dentin surface treatment: no laser; Nd: YAG laser (1.5 W, 100 mJ, 15 Hz); diode laser (2.5 W in CW), and Er: YAG laser (1 W, 100 mJ, 10 Hz). The teeth were divided into four subgroups according to the sealer used: AH Plus, EndoREZ, Epiphany, and EpiphanySE. For testing the sealing after root canal obturation, the penetration of silver nitrate solution was measured, whereas to evaluate the adaptation and penetration of the sealer into the dentin, environmental scanning electron microscopy (ESEM) was used. The ESEM images were analyzed using a four-grade criteria score by three evaluators. The inter-examiner agreement was confirmed by Kappa test and the scores statistically compared by the Kruskal-Wallis'test (p < 0.05). Both adaptation and sealer penetration in root canals were not affected by the laser irradiation. Nd: YAG and diode laser decreased the tracer penetration for AH Plus, whereas EndoREZ and EpiphanySE performances were affected by Nd: YAG irradiation (p < 0.05). It can be concluded that intracanal laser irradiation can be used as an adjunct in endodontic treatment; however, the use of hydrophilic resin sealers should be avoided when root canals were irradiated with Nd: YAG laser. (C) The Authors. Published by SPIE under a Creative Commons Attribution 3.0 Unported License.
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Palavras-chave
adaptation, tag formation, resin sealers, high-intensity lasers, apical sealing, root canal, endodontics
Como citar
Journal Of Biomedical Optics. Bellingham: Spie-soc Photo-optical Instrumentation Engineers, v. 20, n. 3, 7 p., 2015.