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On the determination of stress profiles in expanded austenite by grazing incidence X-ray diffraction and successive layer removal

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Surface layers of expanded austenite resulting from nitriding typically exhibit large gradients in residual stress and composition. Evaluation of residual-stress profiles is explored by means of grazing incidence X-ray diffraction (GI-XRD), probing shallow depths, combined with successive layer removal. Several factors complicating the stress determination are analysed and discussed: (1) ghost stresses arising from a small variation in the shallow information depths probed with GI-XRD, (2) selection of the grain interaction model used to calculate the X-ray elastic constants for conversion of lattice strains into residual stress and (3) the composition dependence of these elastic constants.

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Expanded austenite, Gas nitriding, Low temperature surface hardening, Stress analysis, X-ray diffraction

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Inglês

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Acta Materialia, v. 94, p. 271-280.

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