Publicação: Influence of temperature on the microstructure and electrical properties of BBT thin films
Carregando...
Data
Orientador
Coorientador
Pós-graduação
Curso de graduação
Título da Revista
ISSN da Revista
Título de Volume
Editor
Taylor & Francis Ltd
Tipo
Artigo
Direito de acesso
Acesso restrito
Resumo
The BBT films were prepared by a spin-coating process from the polymeric precursor method (Pechini process). In order to study the influence of the temperature on the BBT microstructure and electrical properties, the films were deposited on platinum coated silicon substrates and annealed from 700degreesC to 800degreesC for 2 hours in oxygen atmosphere. The crystallinity of the films was examined by X-ray diffraction while the surface morphology was analysed by atomic force microscope. The dielectric properties and dissipation factor of BaBi2Ta2O9 films at 1 MHz were observed. The polarization-electric field hysteresis loops revealed the ferroelectric characteristics of BaBi2Ta2O9 thin films.
Descrição
Palavras-chave
BBT, thin films, electrical properties
Idioma
Inglês
Como citar
Integrated Ferroelectrics. Abingdon: Taylor & Francis Ltd, v. 51, p. 103-112, 2003.