Interferometric measurements of nanometric displacements in a Piezoelectric Flextensional Actuator by using the new J1...J5 method

dc.contributor.authorMarcal, Luiz A. P. [UNESP]
dc.contributor.authorGaleti, Jose Henrique [UNESP]
dc.contributor.authorHiguti, Ricardo T. [UNESP]
dc.contributor.authorKitano, Claudio [UNESP]
dc.contributor.authorSilva, Emilio C. N.
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.contributor.institutionUniversidade de São Paulo (USP)
dc.date.accessioned2014-05-27T11:27:18Z
dc.date.available2015-11-16T15:25:46Z
dc.date.issued2012-12-01
dc.description.abstractIn this work, nanometric displacement amplitudes of a Piezoelectric Flextensional Actuator (PFA) designed using the topology optimization technique and operating in its linear range are measured by using a homodyne Michelson interferometer. A new improved version of the J1...J4 method for optical phase measurements, named J1...J5 method, is presented, which is of easier implementation than the original one. This is a passive phase detection scheme, unaffected by signal fading, source instabilities and changes in visibility. Experimental results using this improvement were compared with those obtained by using the J1... J4, J1...J6(pos) and J1...J 6(neg) methods, concluding that the dynamic range is increased while maintaining the sensitivity. Analysis based on the 1/f voltage noise and random fading show the new method is more stable to phase drift than all those methods. © 2012 IEEE.en
dc.description.affiliationDepartment of Electrical Engineering Universidade Estadual Paulista - UNESP., Ilha Solteira, SP
dc.description.affiliationDepartment of Mechatronics and Mechanical Systems Engineering Escola Politécnica da Universidade de São Paulo - EPUSP, São Paulo
dc.description.affiliationUnespDepartment of Electrical Engineering Universidade Estadual Paulista - UNESP., Ilha Solteira, SP
dc.format.extent6
dc.identifierhttp://dx.doi.org/10.1109/INDUSCON.2012.6452451
dc.identifier.citation2012 10th IEEE/ias International Conference on Industry Applications (induscon). New York: IEEE, p. 6, 2012.
dc.identifier.doi10.1109/INDUSCON.2012.6452451
dc.identifier.lattes2883440351895167
dc.identifier.lattes6405339510883203
dc.identifier.orcid0000-0003-4201-5617
dc.identifier.orcid0000-0001-6320-755X
dc.identifier.scopus2-s2.0-84874438910
dc.identifier.urihttp://hdl.handle.net/11449/130571
dc.identifier.wosWOS:000318021500043
dc.language.isoeng
dc.publisherIEEE
dc.relation.ispartof2012 10th IEEE/IAS International Conference on Industry Applications, INDUSCON 2012
dc.rights.accessRightsAcesso aberto
dc.sourceScopus
dc.subjectDynamic range
dc.subjectFlextensional actuator
dc.subjectHomodynes
dc.subjectInterferometric measurement
dc.subjectLinear range
dc.subjectNanometric displacements
dc.subjectOptimization techniques
dc.subjectPassive phase
dc.subjectPhase drift
dc.subjectSignal fading
dc.subjectVoltage noise
dc.subjectActuators
dc.subjectIndustrial applications
dc.subjectMichelson interferometers
dc.subjectSensitivity analysis
dc.subjectPiezoelectricity
dc.titleInterferometric measurements of nanometric displacements in a Piezoelectric Flextensional Actuator by using the new J1...J5 methoden
dc.typeTrabalho apresentado em evento
dcterms.licensehttp://www.ieee.org/publications_standards/publications/rights/rights_policies.html
dcterms.rightsHolderIEEE
unesp.author.lattes6405339510883203[3]
unesp.author.lattes2883440351895167[4]
unesp.author.orcid0000-0003-4201-5617[3]
unesp.author.orcid0000-0001-6320-755X[4]
unesp.campusUniversidade Estadual Paulista (Unesp), Faculdade de Engenharia, Ilha Solteirapt
unesp.departmentEngenharia Elétrica - FEISpt

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