Refractive and geometric lens characterization through multi-wavelength digital speckle pattern interferometry

dc.contributor.authorBarbosa, Eduardo A. [UNESP]
dc.contributor.authordos Santos, Silas C. [UNESP]
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.date.accessioned2014-05-20T15:33:37Z
dc.date.available2014-05-20T15:33:37Z
dc.date.issued2008-03-01
dc.description.abstractPhysical parameters of different types of lenses were measured through digital speckle pattern interferometry (DSPI) using a multimode diode laser as light source. When such lasers emit two or more longitudinal modes simultaneously the speckle image of an object appears covered of contour fringes. By performing the quantitative fringe evaluation the radii of curvature as well as the refractive indexes of the lenses were determined. The fringe quantitative evaluation was carried out through the four- and the eight-stepping techniques and the branch-cut method was employed for phase unwrapping. With all these parameters the focal length was calculated. This whole-field multi-wavelength method does enable the characterization of spherical and aspherical lenses and of positive and negative ones as well. (C) 2007 Elsevier B.V. All rights reserved.en
dc.description.affiliationUniv Estadual Paulista, CEETEPS, Fac Tecnol São Paulo, Lab Opt Aplicada, BR-01124060 São Paulo, Brazil
dc.description.affiliationUnespUniv Estadual Paulista, CEETEPS, Fac Tecnol São Paulo, Lab Opt Aplicada, BR-01124060 São Paulo, Brazil
dc.format.extent1022-1029
dc.identifierhttp://dx.doi.org/10.1016/j.optcom.2007.10.077
dc.identifier.citationOptics Communications. Amsterdam: Elsevier B.V., v. 281, n. 5, p. 1022-1029, 2008.
dc.identifier.doi10.1016/j.optcom.2007.10.077
dc.identifier.issn0030-4018
dc.identifier.urihttp://hdl.handle.net/11449/42192
dc.identifier.wosWOS:000252762900017
dc.language.isoeng
dc.publisherElsevier B.V.
dc.relation.ispartofOptics Communications
dc.relation.ispartofjcr1.887
dc.relation.ispartofsjr0,614
dc.rights.accessRightsAcesso restrito
dc.sourceWeb of Science
dc.subjectspeckleen
dc.subjectDSPL synthetic wavelengthen
dc.subjectlens measurementen
dc.titleRefractive and geometric lens characterization through multi-wavelength digital speckle pattern interferometryen
dc.typeArtigo
dcterms.licensehttp://www.elsevier.com/about/open-access/open-access-policies/article-posting-policy
dcterms.rightsHolderElsevier B.V.

Arquivos

Licença do Pacote

Agora exibindo 1 - 2 de 2
Nenhuma Miniatura disponível
Nome:
license.txt
Tamanho:
1.71 KB
Formato:
Item-specific license agreed upon to submission
Descrição:
Nenhuma Miniatura disponível
Nome:
license.txt
Tamanho:
1.71 KB
Formato:
Item-specific license agreed upon to submission
Descrição:

Coleções