Publicação: New method for self-heating estimation using only DC measurements
| dc.contributor.author | Mori, C. A. B. | |
| dc.contributor.author | Agopian, P. G. D. [UNESP] | |
| dc.contributor.author | Martino, J. A. | |
| dc.contributor.author | Gamiz, F. | |
| dc.contributor.author | Sverdlov, V | |
| dc.contributor.author | Sampedro, C. | |
| dc.contributor.author | Donetti, L. | |
| dc.contributor.institution | Universidade de São Paulo (USP) | |
| dc.contributor.institution | Universidade Estadual Paulista (Unesp) | |
| dc.date.accessioned | 2021-06-25T11:22:53Z | |
| dc.date.available | 2021-06-25T11:22:53Z | |
| dc.date.issued | 2018-01-01 | |
| dc.description.abstract | This paper reports a new method for estimating the thermal resistance of a device using the inverse of the transistor efficiency as a function of the power applied to the transistor's channel. The advantages of this new method are the use of DC measurements only and errors smaller than 4% in the estimation of the channel temperature increase due to the SHE when compared to a pulsed method for the UTBB SOI studied in this work. | en |
| dc.description.affiliation | Univ Sao Paulo, LSI PSI USP, Sao Paulo, Brazil | |
| dc.description.affiliation | Sao Paulo State Univ UNESP, Sao Joao Da Boa Vista, Brazil | |
| dc.description.affiliationUnesp | Sao Paulo State Univ UNESP, Sao Joao Da Boa Vista, Brazil | |
| dc.description.sponsorship | Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq) | |
| dc.description.sponsorship | Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP) | |
| dc.format.extent | 149-152 | |
| dc.identifier.citation | 2018 Joint International Eurosoi Workshop And International Conference On Ultimate Integration On Silicon (eurosoi-ulis). New York: Ieee, p. 149-152, 2018. | |
| dc.identifier.issn | 2330-5738 | |
| dc.identifier.uri | http://hdl.handle.net/11449/208856 | |
| dc.identifier.wos | WOS:000576960300038 | |
| dc.language.iso | eng | |
| dc.publisher | Ieee | |
| dc.relation.ispartof | 2018 Joint International Eurosoi Workshop And International Conference On Ultimate Integration On Silicon (eurosoi-ulis) | |
| dc.source | Web of Science | |
| dc.subject | Self-heating effect | |
| dc.subject | Silicon-On-Insulator | |
| dc.subject | UTBB | |
| dc.title | New method for self-heating estimation using only DC measurements | en |
| dc.type | Trabalho apresentado em evento | |
| dcterms.license | http://www.ieee.org/publications_standards/publications/rights/rights_policies.html | |
| dcterms.rightsHolder | Ieee | |
| dspace.entity.type | Publication |