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Fundamentals of Simulated Annealing

dc.contributor.authorMonticelli, Alcir J.
dc.contributor.authorRomero, Rubén [UNESP]
dc.contributor.authorAsada, Eduardo Nobuhiro
dc.contributor.institutionUniversidade Estadual de Campinas (UNICAMP)
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)
dc.contributor.institutionUniversidade de São Paulo (USP)
dc.date.accessioned2022-04-29T09:12:14Z
dc.date.available2022-04-29T09:12:14Z
dc.date.issued2007-06-08
dc.description.affiliationEstadual de Campinas University, Campinas, Sao Paulo
dc.description.affiliationDepartment of Electrical Engineering Estadual Paulista Julio de Mesquita Filho University, Sao Paulo
dc.description.affiliationDepartment of Electrical Engineering School of Engineering of Sao Carlos University of Sao Paulo, Sao Carlos, Sao Paulo
dc.description.affiliationUnespDepartment of Electrical Engineering Estadual Paulista Julio de Mesquita Filho University, Sao Paulo
dc.format.extent123-146
dc.identifierhttp://dx.doi.org/10.1002/9780470225868.ch7
dc.identifier.citationModern Heuristic Optimization Techniques: Theory and Applications to Power Systems, p. 123-146.
dc.identifier.doi10.1002/9780470225868.ch7
dc.identifier.scopus2-s2.0-84889473419
dc.identifier.urihttp://hdl.handle.net/11449/232176
dc.language.isoeng
dc.relation.ispartofModern Heuristic Optimization Techniques: Theory and Applications to Power Systems
dc.sourceScopus
dc.subjectDefect-free crystals
dc.subjectSimulated annealing (SA)
dc.subjectTransmission network expansion planning problem
dc.titleFundamentals of Simulated Annealingen
dc.typeCapítulo de livro
unesp.departmentEngenharia Elétrica - FEISpt

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