Measurement of low-derivative surface lenses by two-laser holography with Bi12TiO20 crystals

dc.contributor.authorBarbosa, Eduardo A. [UNESP]
dc.contributor.authorde Sousa, Camila B. F. [UNESP]
dc.contributor.authorMaffei, Wellington M. [UNESP]
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.date.accessioned2014-05-20T15:33:52Z
dc.date.available2014-05-20T15:33:52Z
dc.date.issued2009-09-20
dc.description.abstractRefractive and profilometric analyses of lenses with large radii of curvature and/or large focal distance were performed through photorefractive holography using a Bi12TiO20 crystal as the recording medium and two red diode lasers as light sources. Both lasers were properly aligned and tuned in order to provide submillimetric synthetic wavelengths providing real-time interferograms in a two-color holography experiment. The resulting contour interferogram describes the form of the wavefront after the beam traveled back and forth through the lens. The fringe quantitative evaluation was carried out through the four-stepping technique, and the resulting phase map and the branch-cut method were employed for phase unwrapping. Exact ray tracing calculation was performed in order to establish a relation between the output wavefront geometry and the lens parameters such as radii of curvature, thickness, and refractive index. By quantitatively comparing the theoretically calculated wavefront geometry with the experimental results, errors below 1% for both refractive index and focal length were obtained. (C) 2009 Optical Society of Americaen
dc.description.affiliationUniv Estadual Paulista, CEETEPS, Fac Tecnol São Paulo, Lab Opt Aplicada, BR-01124060 São Paulo, Brazil
dc.description.affiliationUnespUniv Estadual Paulista, CEETEPS, Fac Tecnol São Paulo, Lab Opt Aplicada, BR-01124060 São Paulo, Brazil
dc.description.sponsorshipConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)
dc.description.sponsorshipFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
dc.description.sponsorshipIdCNPq: 473458/2006-3
dc.format.extent5114-5120
dc.identifierhttp://dx.doi.org/10.1364/AO.48.005114
dc.identifier.citationApplied Optics. Washington: Optical Soc Amer, v. 48, n. 27, p. 5114-5120, 2009.
dc.identifier.doi10.1364/AO.48.005114
dc.identifier.fileWOS000270117900015.pdf
dc.identifier.issn1559-128X
dc.identifier.urihttp://hdl.handle.net/11449/42341
dc.identifier.wosWOS:000270117900015
dc.language.isoeng
dc.publisherOptical Soc Amer
dc.relation.ispartofApplied Optics
dc.relation.ispartofjcr1.791
dc.rights.accessRightsAcesso restrito
dc.sourceWeb of Science
dc.titleMeasurement of low-derivative surface lenses by two-laser holography with Bi12TiO20 crystalsen
dc.typeArtigo
dcterms.licensehttp://www.opticsinfobase.org/submit/review/pub_charge.cfm#OA
dcterms.rightsHolderOptical Soc Amer

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