Publicação: Storage moduli, loss moduli and damping factor of GaAs and Ga1-xMnxAs thin films using DMA 2980
dc.contributor.author | Kemei, S. K. | |
dc.contributor.author | Kirui, M. S. K. | |
dc.contributor.author | Ndiritu, F. G. | |
dc.contributor.author | Odhiambo, P. M. | |
dc.contributor.author | Ngumbu, R. G. | |
dc.contributor.author | Leite, D. M. G. [UNESP] | |
dc.contributor.author | Pereira, A. L. J. [UNESP] | |
dc.contributor.institution | Egerton Univ | |
dc.contributor.institution | Universidade Estadual Paulista (Unesp) | |
dc.date.accessioned | 2014-12-03T13:09:00Z | |
dc.date.available | 2014-12-03T13:09:00Z | |
dc.date.issued | 2014-04-01 | |
dc.description.abstract | The spin injector part of spintronic FET and diodes suffers from fatigue due to rising heat on the depletion layer. In this study the stiffness of Ga1-xMnxAs spin injector in terms of storage modulus with respect to a varying temperature, 45 degrees C <= T <= 70 degrees C was determined. It was observed that the storage modulus for MDLs (Manganese Doping Levels) of 0%, 1% and 10% decreased with increase in temperature while that with MDLs of 20% and 50% increase with increase in temperature. MDLs of 20% and 50% appear not to allow for damping but MDLs <= 20% allow damping at temperature range of 45 degrees C <= T <= 70 degrees C. The magnitude of storage moduli of GaAs is smaller than that for ferromagnetic Ga1-xMnxAs systems. The loss moduli for GaAs were found to reduce with increase in temperature. Its magnitude of reducing gradient is smaller than Ga1-xMnxAs systems. The two temperature extremes show a general reduction in loss moduli for different MDLs at the study temperature range. From damping factor analysis, damping factors for ferromagnetic Ga1-xMnxAs was found to increase with decrease in MDLs contrary to GaAs which recorded the largest damping factor at 45 degrees C <= T <= 70 degrees C Hence, MDL of 20% shows little damping followed by 50% while MDL of 0% has the most damping in an increasing trend with temperature. (C) 2013 Elsevier Ltd. All rights reserved. | en |
dc.description.affiliation | Egerton Univ, Dept Phys, Egerton, Kenya | |
dc.description.affiliation | Sao Paulo State Univ, Adv Mat Grp, BR-17033360 Bauru, SP, Brazil | |
dc.description.affiliationUnesp | Sao Paulo State Univ, Adv Mat Grp, BR-17033360 Bauru, SP, Brazil | |
dc.format.extent | 23-26 | |
dc.identifier | http://dx.doi.org/10.1016/j.mssp.2013.12.011 | |
dc.identifier.citation | Materials Science In Semiconductor Processing. Oxford: Elsevier Sci Ltd, v. 20, p. 23-26, 2014. | |
dc.identifier.doi | 10.1016/j.mssp.2013.12.011 | |
dc.identifier.issn | 1369-8001 | |
dc.identifier.uri | http://hdl.handle.net/11449/111817 | |
dc.identifier.wos | WOS:000332445100005 | |
dc.language.iso | eng | |
dc.publisher | Elsevier B.V. | |
dc.relation.ispartof | Materials Science in Semiconductor Processing | |
dc.relation.ispartofjcr | 2.593 | |
dc.relation.ispartofsjr | 0,634 | |
dc.rights.accessRights | Acesso restrito | |
dc.source | Web of Science | |
dc.subject | Storage modulus | en |
dc.subject | Loss modulus | en |
dc.subject | Damping | en |
dc.subject | Dynamic mechanical analysis | en |
dc.subject | Manganese doping levels | en |
dc.title | Storage moduli, loss moduli and damping factor of GaAs and Ga1-xMnxAs thin films using DMA 2980 | en |
dc.type | Artigo | |
dcterms.license | http://www.elsevier.com/about/open-access/open-access-policies/article-posting-policy | |
dcterms.rightsHolder | Elsevier B.V. | |
dspace.entity.type | Publication | |
unesp.author.orcid | 0000-0002-1792-6171[6] | |
unesp.author.orcid | 0000-0003-4757-8080[7] |