Publicação: Effect of hydrogenation on the optical and structural properties of GaAs thin films prepared by rf-magnetron sputtering
dc.contributor.author | Azevedo, G. D. | |
dc.contributor.author | Da Silva, JHD | |
dc.contributor.author | Avendano, E. | |
dc.contributor.institution | Lab Nacl Luz Sincrotron | |
dc.contributor.institution | Universidade Estadual Paulista (Unesp) | |
dc.contributor.institution | Univ Costa Rica | |
dc.date.accessioned | 2014-05-20T15:20:21Z | |
dc.date.available | 2014-05-20T15:20:21Z | |
dc.date.issued | 2005-08-01 | |
dc.description.abstract | We have utilized infra-red and optical absorption measurements, grazing incidence X-ray diffraction (GIXRD) and extended X-ray absorption fine structure (EXAFS) measurements to investigate the influence of hydrogenation on the optical and structural properties of GaAs thin films prepared by rf-magnetron sputtering. Hydrogenation induces distinct changes in the optical properties, namely shifts in the absorption edges and reduction of the Urbach energy. Such modifications are correlated to a reduction in structural disorder as determined by EXAFS and the increase of crystallinity determined by GIXRD. (c) 2005 Elsevier B.V. All rights reserved. | en |
dc.description.affiliation | Lab Nacl Luz Sincrotron, BR-13084971 Campinas, SP, Brazil | |
dc.description.affiliation | UNESP, Fac Ciências, BR-17033360 Bauru, SP, Brazil | |
dc.description.affiliation | Univ Costa Rica, Ctr Ciência & Ingn Mat, San Jose 2060, Costa Rica | |
dc.description.affiliationUnesp | UNESP, Fac Ciências, BR-17033360 Bauru, SP, Brazil | |
dc.format.extent | 329-333 | |
dc.identifier | http://dx.doi.org/10.1016/j.nimb.2005.06.071 | |
dc.identifier.citation | Nuclear Instruments & Methods In Physics Research Section B-beam Interactions With Materials and Atoms. Amsterdam: Elsevier B.V., v. 238, n. 1-4, p. 329-333, 2005. | |
dc.identifier.doi | 10.1016/j.nimb.2005.06.071 | |
dc.identifier.issn | 0168-583X | |
dc.identifier.uri | http://hdl.handle.net/11449/31673 | |
dc.identifier.wos | WOS:000232390400069 | |
dc.language.iso | eng | |
dc.publisher | Elsevier B.V. | |
dc.relation.ispartof | Nuclear Instruments & Methods In Physics Research Section B-beam Interactions With Materials and Atoms | |
dc.relation.ispartofjcr | 1.323 | |
dc.rights.accessRights | Acesso restrito | pt |
dc.source | Web of Science | |
dc.subject | EXAFS | pt |
dc.subject | gallium arsenide | pt |
dc.subject | GaAs | pt |
dc.subject | sputtering | pt |
dc.subject | hydrogenation | pt |
dc.title | Effect of hydrogenation on the optical and structural properties of GaAs thin films prepared by rf-magnetron sputtering | en |
dc.type | Artigo | pt |
dcterms.license | http://www.elsevier.com/about/open-access/open-access-policies/article-posting-policy | |
dcterms.rightsHolder | Elsevier B.V. | |
dspace.entity.type | Publication | |
unesp.author.orcid | 0000-0003-0301-3280[1] | |
unesp.author.orcid | 0000-0003-0969-6481[2] | |
unesp.campus | Universidade Estadual Paulista (UNESP), Faculdade de Ciências, Bauru | pt |
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