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dc.contributor.authorFrancisco, MSP
dc.contributor.authorNascente, PAP
dc.contributor.authorMastelaro, V. R.
dc.contributor.authorFlorentino, A. O.
dc.date.accessioned2014-05-20T13:53:17Z
dc.date.available2014-05-20T13:53:17Z
dc.date.issued2001-07-01
dc.identifierhttp://dx.doi.org/10.1116/1.1345911
dc.identifier.citationJournal of Vacuum Science & Technology A-vacuum Surfaces and Films. Melville: Amer Inst Physics, v. 19, n. 4, p. 1150-1157, 2001.
dc.identifier.issn0734-2101
dc.identifier.urihttp://hdl.handle.net/11449/19004
dc.description.abstractX-ray photoelectron spectroscopy (XPS), x-ray diffraction (XRD), and x-ray absorption spectroscopy (XAS) techniques have been applied to characterize the surface composition and structure of a series of CuO-TiO2-CeO2 catalysts. For a small loading of cerium, ceria was mainly dispersed on the titania surface and a minor amount of CeO2 crystallite appeared. At higher loading of cerium, the CeO2 phase increased and the atomic Ce/Ti ratio values were smaller than the nominal composition, as a consequence of cerium agglomeration. This result suggests that only a fraction of cerium can be spread on the titania surface. For titanium-based mixed oxide, we observed that cerium is found as Ce3+ uniquely on the surface. The atomic Cu/(Ce+Ti) ratio values showed no influence from cerium concentration on the dispersion of copper, although the copper on the surface was shown to be dependent on the cerium species. For samples with a high amount of cerium, XPS analysis indicated the raise of second titanium species due cerium with spin-orbit components at higher binding energies than those presented by Ti4+ in a tetragonal structure. The structural results obtained by XAS are consistent with those obtained by XRD and XPS. (C) 2001 American Vacuum Society.en
dc.format.extent1150-1157
dc.language.isoeng
dc.publisherAmerican Institute of Physics (AIP)
dc.relation.ispartofJournal of Vacuum Science & Technology A-vacuum Surfaces and Films
dc.sourceWeb of Science
dc.titleX-ray photoelectron spectroscopy, x-ray absorption spectroscopy, and x-ray diffraction characterization of CuO-TiO2-CeO2 catalyst systemen
dc.typeArtigo
dcterms.licensehttp://publishing.aip.org/authors/web-posting-guidelines
dcterms.rightsHolderAmer Inst Physics
dc.contributor.institutionUniversidade Federal de São Carlos (UFSCar)
dc.contributor.institutionUniversidade de São Paulo (USP)
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.description.affiliationUniv Fed Sao Carlos, Dept Mat Engn, Ctr Caracterizacao & Desenvolvimento Mat, BR-13565905 Sao Carlos, SP, Brazil
dc.description.affiliationUniv São Paulo, Dept Fis & Ciência Mat, Inst Fis Sao Carlos, BR-13560970 Sao Carlos, SP, Brazil
dc.description.affiliationUniv Estadual Paulista, Dept Quim, Inst Biociencias, BR-18618000 Botucatu, SP, Brazil
dc.description.affiliationUnespUniv Estadual Paulista, Dept Quim, Inst Biociencias, BR-18618000 Botucatu, SP, Brazil
dc.identifier.doi10.1116/1.1345911
dc.identifier.wosWOS:000170110900023
dc.rights.accessRightsAcesso restrito
unesp.campusUniversidade Estadual Paulista (Unesp), Instituto de Biociências, Botucatupt
dc.identifier.fileWOS000170110900023.pdf
unesp.author.orcid0000-0002-6512-2530[3]
unesp.author.orcid0000-0001-9512-4214[3]
dc.relation.ispartofjcr1.761
dc.relation.ispartofsjr0,520
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