Simple method for detection of the self-heating signature
| dc.contributor.author | Mori, C. A. B. | |
| dc.contributor.author | Agopian, P. G. D. [UNESP] | |
| dc.contributor.author | Martino, J. A. | |
| dc.contributor.author | IEEE | |
| dc.contributor.institution | Universidade de São Paulo (USP) | |
| dc.contributor.institution | Universidade Estadual Paulista (Unesp) | |
| dc.date.accessioned | 2018-11-26T15:47:35Z | |
| dc.date.available | 2018-11-26T15:47:35Z | |
| dc.date.issued | 2017-01-01 | |
| dc.description.abstract | This paper reports a simple method for detection of the self-heating effect through a special signature, without the need of specific structures or high frequency systems, even in devices presenting positive output conductances. In order to develop this method, simple numerical models were employed, and later verified through experimental observation with pFinFET devices. | en |
| dc.description.affiliation | Univ Sao Paulo, LSI PSI, Sao Paulo, Brazil | |
| dc.description.affiliation | Sao Paulo State Univ UNESP, Sao Joao Da Boa Vista, Brazil | |
| dc.description.affiliationUnesp | Sao Paulo State Univ UNESP, Sao Joao Da Boa Vista, Brazil | |
| dc.description.sponsorship | Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP) | |
| dc.description.sponsorship | Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq) | |
| dc.format.extent | 4 | |
| dc.identifier.citation | 2017 32nd Symposium On Microelectronics Technology And Devices (sbmicro): Chip On The Sands. New York: Ieee, 4 p., 2017. | |
| dc.identifier.lattes | 0496909595465696 | |
| dc.identifier.orcid | 0000-0002-0886-7798 | |
| dc.identifier.uri | http://hdl.handle.net/11449/160129 | |
| dc.identifier.wos | WOS:000426524500005 | |
| dc.language.iso | eng | |
| dc.publisher | Ieee | |
| dc.relation.ispartof | 2017 32nd Symposium On Microelectronics Technology And Devices (sbmicro): Chip On The Sands | |
| dc.rights.accessRights | Acesso aberto | |
| dc.source | Web of Science | |
| dc.subject | Self-heating effect | |
| dc.subject | FinFET | |
| dc.subject | Semiconductor-On-Insulator | |
| dc.title | Simple method for detection of the self-heating signature | en |
| dc.type | Trabalho apresentado em evento | |
| dcterms.license | http://www.ieee.org/publications_standards/publications/rights/rights_policies.html | |
| dcterms.rightsHolder | Ieee | |
| unesp.author.lattes | 0496909595465696[2] | |
| unesp.author.orcid | 0000-0002-0886-7798[2] |