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Probing free-carrier recombination in silicon strip nano-waveguides

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dc.contributor.authorAldaya, Ivan [UNESP]
dc.contributor.authorGil-Molina, Andres
dc.contributor.authorPita, Julian L.
dc.contributor.authorGabrielli, Lucas H.
dc.contributor.authorFragnito, Hugo L.
dc.contributor.authorDainese, Paulo
dc.contributor.authorIEEE
dc.contributor.institutionUniversidade Estadual de Campinas (UNICAMP)
dc.contributor.institutionUniversidade Estadual Paulista (Unesp)
dc.contributor.institutionUniv Prebiteriana Mackenzie
dc.date.accessioned2020-12-10T17:30:12Z
dc.date.available2020-12-10T17:30:12Z
dc.date.issued2018-01-01
dc.description.abstractWe analyze recombination dynamics of photo-generated free-carriers in strip silicon nanowaveguides, revealing a highly nonlinear decay dynamics with a time-dependent lifetime ranging from similar to 800 ps at the beginning to similar to 300 ns at the end of the decay.en
dc.description.affiliationUniv Estadual Campinas, Gleb Wataghin Phys Inst, BR-13083970 Campinas, SP, Brazil
dc.description.affiliationUniv Estadual Campinas, Sch Elect & Comp Engn, BR-13083970 Campinas, SP, Brazil
dc.description.affiliationState Univ Sao Paulo, Campus Sao Joao Boa Vista, BR-13876750 Sao Paulo, SP, Brazil
dc.description.affiliationUniv Prebiteriana Mackenzie, MackGraphe, BR-01302907 Sao Paulo, SP, Brazil
dc.description.affiliationUnespState Univ Sao Paulo, Campus Sao Joao Boa Vista, BR-13876750 Sao Paulo, SP, Brazil
dc.description.sponsorshipFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
dc.description.sponsorshipConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)
dc.description.sponsorshipCoordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)
dc.description.sponsorshipIdFAPESP: 08/57857-2
dc.description.sponsorshipIdFAPESP: 13/20180-3
dc.description.sponsorshipIdFAPESP: 15/04113-0
dc.description.sponsorshipIdCNPq: 574017/2008-9
dc.format.extent2
dc.identifier.citation2018 Conference On Lasers And Electro-optics (cleo). New York: Ieee, 2 p., 2018.
dc.identifier.issn2160-9020
dc.identifier.urihttp://hdl.handle.net/11449/195307
dc.identifier.wosWOS:000526031000186
dc.language.isoeng
dc.publisherIeee
dc.relation.ispartof2018 Conference On Lasers And Electro-optics (cleo)
dc.sourceWeb of Science
dc.titleProbing free-carrier recombination in silicon strip nano-waveguidesen
dc.typeTrabalho apresentado em evento
dcterms.licensehttp://www.ieee.org/publications_standards/publications/rights/rights_policies.html
dcterms.rightsHolderIeee
dspace.entity.typePublication

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