Publicação: Determining the interfacial density of states in metal-insulator-semiconductor devices based on poly(3-hexylthiophene)
Carregando...
Arquivos
Data
Autores
Orientador
Coorientador
Pós-graduação
Curso de graduação
Título da Revista
ISSN da Revista
Título de Volume
Editor
American Institute of Physics (AIP)
Tipo
Artigo
Direito de acesso
Acesso aberto
Resumo
Low frequency admittance measurements are used to determine the density of interface states in metal-insulator-semiconductor diodes based on the unintentionally doped, p-type semiconductor poly(3-hexylthiophene). After vacuum annealing at 90 degrees C, interface hole trapping states are shown to be distributed in energy with their density decreasing approximately linearly from similar to 20x10(10) to 5x10(10) cm(-2) eV(-1) over an energy range extending from 0.05 to 0.25 eV above the bulk Fermi level. (c) 2008 American Institute of Physics.
Descrição
Palavras-chave
Idioma
Inglês
Como citar
Applied Physics Letters. Melville: Amer Inst Physics, v. 92, n. 10, p. 3, 2008.
